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Proton Testing of nVidia GTX 1050 GPUSingle-Event Effects (SEE) testing was conducted on the nVidia GTX 1050 Graphics Processor Unit (GPU); herein referred to as device under test (DUT). Testing was conducted at Massachusetts General Hospitals (MGH) Francis H. Burr Proton Therapy Center on April 9th, 2017 using 200-MeV protons. This testing trip was purposed to provide a baseline assessment of the radiation susceptibility of the DUT as no previous testing had been conducted on this component.
Document ID
20170009005
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Wyrwas, E. J.
(Lentech, Inc. Greenbelt, MD, United States)
Date Acquired
September 26, 2017
Publication Date
May 1, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN45745
Report Number: GSFC-E-DAA-TN45745
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Proton testing
Graphics Processor Unit (GPU)
Single-Event Effects (SEE)
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