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A comparison of burn-in and bake as semiconductor screening techniques for the nimbus spacecraft programComparison of high temperature storage bake and operating burn-in as screening techniques for semiconductor devices used in Nimbus satellite
Document ID
19650012068
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Ross, I. J. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 2, 2013
Publication Date
April 1, 1965
Subject Category
Electronic Equipment
Report/Patent Number
X-650-65-105
NASA-TM-X-55206
Report Number: X-650-65-105
Report Number: NASA-TM-X-55206
Accession Number
65N21669
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
NIMBUS SATELLITE
SCREENING TECHNIQUE
SEMICONDUCTOR DEVICE

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