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Radiation-resistant device phenomenaElectrical properties of reactively evaporated aluminum oxide films and electron mean free path through metal film
Document ID
19660008886
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Follmer, W. C. (Philco Corp. Blue Bell, PA, United States)
Spratt, J. P. (Philco Corp. Blue Bell, PA, United States)
Date Acquired
August 3, 2013
Publication Date
March 1, 1966
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-389
Report Number: NASA-CR-389
Accession Number
66N18175
Funding Number(s)
CONTRACT_GRANT: NASW-997
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
ELECTRIC PROPERTY
METAL FILM
ELECTRON
ALUMINUM OXIDE
MEAN FREE PATH

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