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Mass spectrometer analysis of solid materials with the ion-microprobe sputter sourceSputter ion source mass spectrometer for analysis of solid materials
Document ID
19670005598
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Herzog, R. F. K. (GCA Corp. Bedford, MA, United States)
Poschenrieder, W. P. (GCA Corp. Bedford, MA, United States)
Satkiewicz, F. G. (GCA Corp. Bedford, MA, United States)
Date Acquired
August 3, 2013
Publication Date
January 1, 1967
Subject Category
Physics, Atomic, Molecular, And Nuclear
Report/Patent Number
NASA-CR-683
Report Number: NASA-CR-683
Accession Number
67N14927
Funding Number(s)
CONTRACT_GRANT: NAS5-9254
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
MASS SPECTROMETER
ION SOURCE
SOLIDS
SPUTTERING

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