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Failure rates for accelerated acceptance testing of silicon transistorsExtrapolation tables for the control of silicon transistor product reliability have been compiled. The tables are based on a version of the Arrhenius statistical relation and are intended to be used for low- and medium-power silicon transistors.
Document ID
19680000497
Acquisition Source
Legacy CDMS
Document Type
Other - NASA Tech Brief
Authors
Toye, C. R.
Date Acquired
August 4, 2013
Publication Date
November 1, 1968
Subject Category
Electronic Components And Circuits
Report/Patent Number
ERC-10198
Report Number: ERC-10198
Accession Number
68B10541
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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