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Curtailed attribute samplingMaximum likelihood estimation of lot defectives based on curtailed attribute sampling
Document ID
19690008025
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Cohen, A. C. (Georgia Univ. Athens, GA, United States)
Date Acquired
August 5, 2013
Publication Date
January 1, 1969
Publication Information
Publisher: NASA. MARSHALL SPACE FLIGHT CENTER
Subject Category
Mathematics
Report/Patent Number
NASA-CR-61255
Report Number: NASA-CR-61255
Accession Number
69N17357
Funding Number(s)
CONTRACT_GRANT: NAS8-11175
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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