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Methods of measurement for semiconductor materials, process control, and devices Quarterly report, 1 Jan. - 31 Mar. 1969Electrical resistivity, carrier lifetime, and electrical inhomogeneities in semiconductor devices
Document ID
19690020789
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Bullis, W. M. (National Bureau of Standards Washington, DC, United States)
Date Acquired
August 5, 2013
Publication Date
July 1, 1969
Subject Category
Physics, Solid-State
Report/Patent Number
NASA-CR-101692
NBS-TN-488
Report Number: NASA-CR-101692
Report Number: NBS-TN-488
Accession Number
69N30167
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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