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Elastohydrodynamic film thickness model for heavily loaded contactsAn empirical elastohydrodynamic (EHD) film thickness formula for predicting the minimum film thickness occurring within heavily loaded contacts (maximum Hertz stresses above 150,000 psi) was developed. The formula was based upon X-ray film thickness measurements made with synthetic paraffinic, fluorocarbon, Type II ester and polyphenyl ether fluids covering a wide range of test conditions. Comparisons were made between predictions from an isothermal EHD theory and the test data. The deduced relationship was found to adequately reflect the high-load dependence exhibited by the measured data. The effects of contact geometry, material and lubricant properties on the form of the empirical model are also discussed.
Document ID
19730018684
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Loewenthal, S. H.
(NASA Lewis Research Center Cleveland, OH, United States)
Parker, R. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Zaretsky, E. V.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 2, 2013
Publication Date
January 1, 1973
Subject Category
Machine Elements And Processes
Report/Patent Number
NASA-TM-X-68267
E-7569
Report Number: NASA-TM-X-68267
Report Number: E-7569
Meeting Information
Meeting: Joint Lubrication Conf.,
Location: Atlanta GA
Country: United States
Start Date: October 16, 1973
End Date: October 18, 1973
Sponsors: Am. Soc. of Lubrication Engr. and ASME
Accession Number
73N27411
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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