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Effects of ionizing radiation on charge-coupled imagersThe effects of ionizing radiation on three different charge coupled imagers have been investigated. Device performance was evaluated as a function of total gamma ray dose. The principal failure mechanisms have been identified for each particular device structure. The clock and bias voltages required for high total dose operation of the devices are presented.
Document ID
19750020770
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Killiany, J. M. (Naval Research Lab. Washington, DC, United States)
Baker, W. D. (Naval Research Lab. Washington, DC, United States)
Saks, N. S. (Naval Research Lab. Washington, DC, United States)
Barbe, D. F. (Naval Research Lab. Washington, DC, United States)
Date Acquired
August 8, 2013
Publication Date
June 10, 1975
Publication Information
Publication: JPL Proc.: Symp. on Charge-Coupled Device Technol. for Sci. Imaging Appl.
Subject Category
Solid-State Physics
Accession Number
75N28843
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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