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MIL-M-38510/470 test vectors: Fault detection efficiency measurement via hardware fault simulationThe stuck fault detection efficiency of the test vectors developed for the MIL-M-38510/470 NASA was measured using a hardware stuck fault simulator for the 1802 microprocessor. Thirty-nine stuck faults were not detected out of a total of 874 injected into the combinatorial and sequential parts of the microprocessor. Since undetected faults can create catastrophic errors in equipment designed for high reliability applications, it is recommended that the MIL-M-38510/470 NASA be enhanced with additional test vectors so as to achieve 100% stuck fault detection efficiency.
Document ID
19800012553
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Timoc, C. C. (Timoc International Co. Flintridge, CA, United States)
Date Acquired
September 4, 2013
Publication Date
March 10, 1980
Subject Category
Computer Operations And Hardware
Report/Patent Number
NASA-CR-162916
JPL-9950-308
Report Number: NASA-CR-162916
Report Number: JPL-9950-308
Accession Number
80N21037
Funding Number(s)
CONTRACT_GRANT: NAS7-100
CONTRACT_GRANT: JPL-955502
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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