Accelerated Alpha-s deterioration in a geostationary orbit

Between the Teflon substrate and the interference filter a 2 micron varnish layer was sandwiched in. The bending radius of the SSM, measured on a cone, decreased from about 13 mm to 6 mm prior to interference filter fracture, due to increased tensile strength of its substrate. These samples, and for comparison samples of the same make but without varnish and a conductive layer were included in the test. Additionally 2 Teflon FEP samples without the protective interference filter, one of them with a conductive layer, were tested. The sample substrate was 125 micron Teflon FEP, with vapor deposited silver reflector and a thin Inconel film for corrosion protection.