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Evaluation and verification of epitaxial process sequence for silicon solar-cell productionTo achieve the program goals, 28 minimodules were fabricated and tested, using 600 cells made from three-inch-diameter wafers processed by the sequence chosen for this purpose. Of these 600 cells, half were made from epitaxially grown layers on potentially low-cost substrates. The other half were made from commercial semiconductor-grade (SG), single-crystal silicon wafers that served as controls. Cell processing was normally performed on mixed lots containing significant numbers of each of these two types of wafers. After evaluation of the performance of all cells, they were separated by types for incorporation into modules that were to be tested for electrical performance and response to environmental stress. A simplified flow chart displaying this scheme, for quantities representing half of the planned total to be processed, is presented.
Document ID
19820018926
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Redfield, D.
(RCA Labs. Princeton, NJ, United States)
Date Acquired
September 4, 2013
Publication Date
November 1, 1981
Subject Category
Energy Production And Conversion
Report/Patent Number
NASA-CR-169044
DOE/JPL-955825-81/3
NAS 1.26:169044
Report Number: NASA-CR-169044
Report Number: DOE/JPL-955825-81/3
Report Number: NAS 1.26:169044
Accession Number
82N26802
Funding Number(s)
CONTRACT_GRANT: NAS7-100
CONTRACT_GRANT: JPL-955825
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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