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Film thickness for different regimes of fluid-film lubricationMathematical formulas are presented which express the dimensionless minimum film thickness for the four lubrication regimes found in elliptical contacts: isoviscous-rigid regime; piezoviscous-rigid regime; isoviscous-elastic regime; and piezoviscous-elastic regime. The relative importance of pressure on elastic distortion and lubricant viscosity is the factor that distinguishes these regimes for a given conjunction geometry. In addition, these equations were used to develop maps of the lubrication regimes by plotting film thickness contours on a log-log grid of the dimensionless viscosity and elasticity parameters for three values of the ellipticity parameter. These results present a complete theoretical film thickness parameter solution for elliptical constants in the four lubrication regimes. The results are particularly useful in initial investigations of many practical lubrication problems involving elliptical conjunctions.
Document ID
19830020178
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Hamrock, B. J.
(NASA Lewis Research Center Cleveland, OH, United States)
Dowson, D.
(Leeds Univ.)
Date Acquired
September 4, 2013
Publication Date
May 1, 1983
Subject Category
Mechanical Engineering
Report/Patent Number
NAS 1.15:81700
NASA-TM-81700
E-209
Report Number: NAS 1.15:81700
Report Number: NASA-TM-81700
Report Number: E-209
Accession Number
83N28449
Funding Number(s)
PROJECT: RTOP 505-32-42
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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