Thickness of Ridged Plains Materials in Hesperia Planum, Mars

The thickness distribution of plains-forming materials in Hesperia Planum is determined by the diameter of partially buried craters. As with all Martian thickness studies, the distribution of measured thicknesses is sparse due to a low number of suitable partially buried craters. The resulting isopach of plains materials has a low level of confidence but is sufficient for generalized thickness trends. The mean of the thickness estimates is 360 + or - 120 m. The isopach of plains-forming materials exhibits an uneven thickness distribution. Average thickness, determined by grid sampling over the region, is 216 + or - 153 m. Local lenses exceed 500 m. A fifth order trend surface provides a partial match (coefficient of correlation = 0.657) to the isopach.