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Thickness of Ridged Plains Materials in Hesperia Planum, MarsThe thickness distribution of plains-forming materials in Hesperia Planum is determined by the diameter of partially buried craters. As with all Martian thickness studies, the distribution of measured thicknesses is sparse due to a low number of suitable partially buried craters. The resulting isopach of plains materials has a low level of confidence but is sufficient for generalized thickness trends. The mean of the thickness estimates is 360 + or - 120 m. The isopach of plains-forming materials exhibits an uneven thickness distribution. Average thickness, determined by grid sampling over the region, is 216 + or - 153 m. Local lenses exceed 500 m. A fifth order trend surface provides a partial match (coefficient of correlation = 0.657) to the isopach.
Document ID
Acquisition Source
Legacy CDMS
Document Type
Dehon, R. A.
(Northeast Louisiana State Coll. Monroe, LA, United States)
Date Acquired
August 12, 2013
Publication Date
April 1, 1985
Publication Information
Publication: NASA, Washington Repts. of Planetary Geol. and Geophys. Program
Subject Category
Lunar And Planetary Exploration
Accession Number
Distribution Limits
Work of the US Gov. Public Use Permitted.
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