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Automated Extraction of Absorption Bands from Reflectance SpecialA multiple high order derivative spectroscopy technique has been developed for deriving wavelength positions, half widths, and heights of absorption bands in reflectance spectra. The technique is applicable to laboratory spectra as well as medium resolution (100-200/cm) telescope or spacecraft spectra with moderate (few percent) noise. The technique permits absorption band positions to be detected with an accuracy of better than 3%, and often better than 1%. The high complexity of radiative transfer processes in diffusely reflected spectra can complicate the determination of absorption band positions. Continuum reflections, random illumination geometries within the material, phase angle effects, composite overlapping bands, and calibration uncertainties can shift apparent band positions by 20% from their actual positions or mask them beyond detection. Using multiple high order derivative analysis, effects of scattering continua, phase angle, and calibration (smooth features) are suppressed. Inflection points that characterize the positions and half widths of constituent bands are enhanced by the process and directly detected with relatively high sensitivity.
Document ID
Acquisition Source
Legacy CDMS
Document Type
Huguenin, R. L.
(Massachusetts Univ. Amherst, MA, United States)
Vale, L.
(Massachusetts Univ. Amherst, MA, United States)
Mcintire, D.
(Massachusetts Univ. Amherst, MA, United States)
Jones, J.
(Massachusetts Univ. Amherst, MA, United States)
Date Acquired
August 12, 2013
Publication Date
April 1, 1985
Publication Information
Publication: NASA, Washington Repts. of Planetary Geol. and Geophys. Program, 1984
Subject Category
Earth Resources And Remote Sensing
Accession Number
Distribution Limits
Work of the US Gov. Public Use Permitted.
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