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AlGaAs growth by OMCVD using an excimer laserAlGaAs has been grown on GaAs by laser assisted OMCVD using an excimer laser, wavelength 193 nm, and a Cambridge OMCVD reactor. Films were grown at temperatures of 450 and 500 C with the laser beam parallel to the surface and impinging onto the surface at 15 deg from parallel. The samples were heated by RF coils while the laser beam was perpendicular to the gas flow. Typical gas flow parameters are 12 slm of H2, 15 sccm of Ga(CH3)3, 13 sccm of Al(CH3)3, and a pressure of 250 mbar. The initial energy density of the beam at the surface was 40 mJ/sq cm, the pulse rate was 20 pps, and the growth time was 7 min. The films were analyzed by Auger electron spectroscopy for the aluminum concentration and by TEM for the surface morphology.
Document ID
19870013871
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Warner, Joseph D.
(NASA Lewis Research Center Cleveland, OH, United States)
Wilt, David M.
(NASA Lewis Research Center Cleveland, OH, United States)
Pouch, John J.
(NASA Lewis Research Center Cleveland, OH, United States)
Aron, Paul R.
(NASA Lewis Research Center Cleveland, OH, United States)
Date Acquired
September 5, 2013
Publication Date
December 1, 1986
Subject Category
Solid-State Physics
Report/Patent Number
NASA-TM-88937
NAS 1.15:88937
E-3379
Accession Number
87N23304
Funding Number(s)
PROJECT: RTOP 307-07-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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