NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Surface inspection: Research and developmentSurface inspection techniques are used for process learning, quality verification, and postmortem analysis in manufacturing for a spectrum of disciplines. First, trends in surface analysis are summarized for integrated circuits, high density interconnection boards, and magnetic disks, emphasizing on-line applications as opposed to off-line or development techniques. Then, a closer look is taken at microcontamination detection from both a patterned defect and a particulate inspection point of view.
Document ID
19870017774
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Batchelder, J. S.
(International Business Machines Corp. Yorktown Heights, NY, United States)
Date Acquired
September 5, 2013
Publication Date
August 1, 1987
Publication Information
Publication: NASA. Langley Research Center, Electronics Reliability and Measurement Technology
Subject Category
Quality Assurance And Reliability
Accession Number
87N27207
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available