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Satellite Material Contaminant Optical PropertiesThe Air Force Wright Research and Development Center and the Arnold Engineering Development Center are continuing a program for measuring optical effects of satellite material outgassing products on cryo-optic surfaces. Presented here are infrared (4000 to 700 cm-1) transmittance data for contaminant films condensed on a 77 K geranium window. From the transmittance data, the contaminant film refractive and absorptive indices (n, k) were derived using an analytical thin-film interference model with a nonlinear least-squares algorithm. To date 19 materials have been studied with the optical contents determined for 13 of those. The materials include adhesives, paints, composites, films, and lubricants. This program is continuing and properties for other materials will be available in the future.
Document ID
19900016213
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
B E Wood
(Calspan Corporation Arnold AFS, TN., United States)
W T Bertrand
(Calspan Corporation Arnold AFS, TN., United States)
B L Seiber
(Calspan Corporation Arnold AFS, TN., United States)
E L Kiech
(Calspan Corporation Arnold AFS, TN., United States)
P M Falco
(Air Force Wright Research and Development Center Wright-Patterson AFB, OH., United States)
J D Holt
(Arnold Engineering Development Center Arnold Air Force Station, TN., United States)
Date Acquired
September 6, 2013
Publication Date
March 1, 1990
Publication Information
Publication: Third Annual Workshop on Space Operations Automation and Robotics (SOAR 1989)
Publisher: National Aeronautics and Space Administration
Subject Category
Optics
Report/Patent Number
NASA-CP-3059
Meeting Information
Meeting: 3rd Annual Workshop on Space Operations Automation and Robotics (SOAR 89)
Location: Houston, TX
Country: US
Start Date: July 25, 1989
End Date: July 27, 1989
Sponsors: National Aeronautics and Space Administration
Accession Number
90N25529
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
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