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sims analysis of extended impact features on ldef experimentDiscussed here are the first Secondary Ion Mass Spectroscopy (SIMS) analysis of projectile material deposited in extended impact features on Ge wafers from the trailing edge. Although most capture cells lost their plastic film covers, they contain extended impact features that apparently were produced by high velocity impacts when the plastic foils were still intact. Detailed optical scanning of all bare capture cells from the trailing edge revealed more than 100 impacts. Fifty-eight were selected by scanning electron microscope (SEM) inspection as prime candidates for SIMS analysis. Preliminary SIMS measurements were made on 15 impacts. More than half showed substantial enhancements of Mg, Al, Si, Ca, and Fe in the impact region, indicating micrometeorites as the projectiles.
Document ID
19910015692
Document Type
Conference Paper
Authors
Amari, S.
(Washington Univ. Saint Louis, MO., United States)
Foote, J.
(Washington Univ. Saint Louis, MO., United States)
Jessberger, E. K.
(Max-Planck-Inst. fuer Kernphysik Heidelberg (Germany, F.R.)., United States)
Simon, C.
(Washington Univ. Saint Louis, MO., United States)
Stadermann, F. J.
(Max-Planck-Inst. fuer Kernphysik, Heidelberg, Germany F.R. , United States)
Swan, P.
(Washington Univ. Saint Louis, MO., United States)
Walker, R.
(Washington Univ. Saint Louis, MO., United States)
Zinner, E.
(Washington Univ. Saint Louis, MO, United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1991
Publication Information
Publication: NASA, Langley Research Center, First LDEF Post-Retrieval Symposium Abstracts
Subject Category
ASTROPHYSICS
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19910015658Analytic PrimaryFirst LDEF Post-Retrieval Symposium abstracts