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post-flight characterization of optical system samples, thermal control samples, and detectors from ldef experiment m0003, sub-experiments 6 and 13Flight samples and control samples of optical and thermal control coatings were measured for hemispheric reflectance and transmission. The samples were exposed directly to the orbital environment, but were on the trailing edge of the LDEF satellite. Preliminary analysis shows no significant change in the reflectance of transmission values of most of the samples. Post-flight tests of avalanche photodiodes is also discussed.
Document ID
19910015754
Document Type
Conference Paper
Authors
Hodgson, Randall R.
(McDonnell-Douglas Electronics Co. Saint Louis, MO., United States)
Holsen, James N.
(McDonnell-Douglas Electronics Co. Saint Louis, MO., United States)
Drerup, Robert A., Jr.
(Air Force Wright Aeronautical Labs. Wright-Patterson AFB, OH., United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1991
Publication Information
Publication: NASA, Langley Research Center, First LDEF Post-Retrieval Symposium Abstracts
Subject Category
NONMETALLIC MATERIALS
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19910015658Analytic PrimaryFirst LDEF Post-Retrieval Symposium abstracts