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ldef electronic systems: successes, failures, and lessonsFollowing the Long Duration Exposure Facility (LDEF) retrieval, the Systems Special Investigation Group (SIG) participated in an extensive series of tests of various electronic systems, including the NASA provided data and initiate systems, and some experiment systems. Overall, these were found to have performed remarkably well, even though most were designed and tested under limited budgets and used at least some nonspace qualified components. However, several anomalies were observed, including a few which resulted in some loss of data. The postflight test program objectives, observations, and lessons learned from these examinations are discussed. All analyses are not yet complete, but observations to date will be summarized, including the Boeing experiment component studies and failure analysis results related to the Interstellar Gas Experiment. Based upon these observations, suggestions for avoiding similar problems on future programs are presented.
Document ID
19910015771
Document Type
Conference Paper
Authors
Miller, Emmett
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Porter, Dave
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Smith, Dave
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Brooks, Larry
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Levorsen, Joe
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Mulkey, Owen
(Boeing Aerospace and Electronics Co. Seattle, WA, United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1991
Publication Information
Publication: NASA, Langley Research Center, First LDEF Post-Retrieval Symposium Abstracts
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19910015658Analytic PrimaryFirst LDEF Post-Retrieval Symposium abstracts