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Experimental measurement and theoretical modeling of microwave scattering and the structure of the sea surface influencing radar observations from spaceThe electromagnetic (EM) bias 'epsilon' is an error present in radar altimetry of the ocean due to the nonuniform reflection from wave troughs and crests. The EM bias is defined as the difference between the mean reflecting surface and the mean sea surface. A knowledge of the EM bias is necessary to permit error reduction in mean sea level measurements by satellite radar altimeters. Direct measurements of the EM bias were made from a Shell Offshore oil production platform in the Gulf of Mexico for a six month period during 1989 and 1990. Measurements of the EM bias were made at 5 and 14 Ghz. During the EM bias experiments by Melville et al., a wire wave gauge was used to obtain the modulation of the high frequency waves by the low frequency waves. It became apparent that the EM bias was primarily caused by the modulation of the short waves. This was reported by Arnold et al. The EM bias is explained using physical optics scattering and an empirical model for the short wave modulation. Measurements of the short wave modulation using a wire wave gauge demonstrated a linear dependence of the normalized bias on the short wave modulation strength, M. The theory accurately predicts this dependence by the relation epsilon = -alphaMH sub 1/3. The wind speed dependence of the normalized bias is explained by the dependence of the short wave modulation strength on the wind speed. While other effects such as long wave tilt and curvature will have an effect on the bias, the primary cause of the bias is shown to be due to the short wave modulation. This report will present a theory using physical optics scattering and an empirical model of the short wave modulation to estimate the EM bias. The estimated EM bias will be compared to measurements at C and Ku bands.
Document ID
19930002818
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Arnold, David
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Kong, J. A.
(Massachusetts Inst. of Tech. Cambridge, MA, United States)
Date Acquired
September 6, 2013
Publication Date
September 30, 1992
Subject Category
Earth Resources And Remote Sensing
Report/Patent Number
NASA-CR-190998
NAS 1.26:190998
Report Number: NASA-CR-190998
Report Number: NAS 1.26:190998
Accession Number
93N12006
Funding Number(s)
CONTRACT_GRANT: NAGW-1272
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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