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High temperature strain gage apparent strain compensationOnce an installed strain gage is connected to a strain indicating device and the instrument is balanced, a subsequent change in temperature of the gage installation will generally produce a resistance change in the gage. This purely temperature-induced resistance will be registered by the indicating device as a strain and is referred to as 'apparent strain' to distinguish it from strain due to applied stress. One desirable technique for apparent strain compensation is to employ two identical gages with identical mounting procedures which are connected with a 'half bridge' configuration where gages see the same thermal environment but only one experiences a mechanical strain input. Their connection in adjacent arms of the bridge will then balance the thermally induced apparent strains and, in principle, only the mechanical strain remains. Two approaches that implement this technique are discussed.
Document ID
19930004484
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Holmes, Harlan K.
(NASA Langley Research Center Hampton, VA, United States)
Moore, T. C., Sr.
(NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 6, 2013
Publication Date
September 1, 1992
Publication Information
Publication: The 1992 NASA Langley Measurement Technology Conference: Measurement Technology for Aerospace Applications in High-Temperature Environments
Subject Category
Instrumentation And Photography
Accession Number
93N13672
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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