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The 1992 NASA Langley Measurement Technology Conference: Measurement Technology for Aerospace Applications in High-Temperature EnvironmentsAn intensive 2-day conference to discuss the current status of measurement technology in the areas of temperature/heat flux, stress/strain, pressure, and flowfield diagnostics for high temperature aerospace applications was held at Langley Research Center, Hampton, Virginia, on April 22 and 23, 1993. Complete texts of the papers presented at the Conference are included in these proceedings.
Document ID
19930004473
Acquisition Source
Legacy CDMS
Document Type
Conference Proceedings
Authors
Singh, Jag J. (NASA Langley Research Center Hampton, VA, United States)
Antcliff, Richard R. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 6, 2013
Publication Date
September 1, 1992
Subject Category
Instrumentation And Photography
Report/Patent Number
L-17127
NASA-CP-3161
NAS 1.55:3161
Accession Number
93N13661
Funding Number(s)
PROJECT: RTOP 505-59-54-02
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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