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Feasibility study of the use of synchrotron radiation in the calibration of AXAF - Initial reflectivity resultsThe 1-percent calibration accuracy goal of the Advanced X-ray Astrophysics Facility is being approached by way of an experiment at the National Synchrotron Light Source that will demonstrate the accuracy achievable in reflectance measurements conducted on coated flat mirrors in the 50 eV-12 keV energy range. The coatings will be of commercially produced Au, Ni, and Ir, deposited either by sputtering or by e-beam deposition. Optical constants will be estimated via the reflectance vs. angle-of-incidence method.
Document ID
19930055663
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Graessle, D. E.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Brissenden, R. J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Cobuzzi, J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Hughes, J. P.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Kellogg, E. M.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Mootz, F. E.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Schwartz, D. A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Slane, P. O.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Zombeck, M. V.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Blake, R. L.
(Los Alamos National Lab. NM, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Optics
Accession Number
93A39660
Funding Number(s)
CONTRACT_GRANT: NAS8-36123
Distribution Limits
Public
Copyright
Other

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