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Multilayer and grazing incidence X-ray/EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991The present conference discusses the Advanced X-ray Astrophysics Facility (AXAF) calibration by means of synchrotron radiation and its X-ray reflectivity, X-ray scattering measurements from thin-foil X-ray mirrors, lobster-eye X-ray optics using microchannel plates, space-based interferometry at EUV and soft X-ray wavelengths, a water-window imaging X-ray telescope, a graded d-spacing multilayer telescope for high energy X-ray astronomy, photographic films for the multispectral solar telescope array, a soft X-ray ion chamber, and the development of hard X-ray optics. Also discussed are X-ray spectroscopy with multilayered optics, a slit aperture for monitoring X-ray experiments, an objective double-crystal spectrometer, a Ly-alpha coronagraph/polarimeter, tungsten/boron nitride multilayers for XUV optical applications, the evaluation of reflectors for soft X-ray optics, the manufacture of elastically bent crystals and multilayer mirrors, and selective photodevices for the VUV.
Document ID
19930055661
Document Type
Conference Proceedings
Authors
Hoover, Richard B. (NASA Marshall Space Flight Center Huntsville, AL, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Subject Category
OPTICS
Report/Patent Number
SPIE-1546
Distribution Limits
Public
Copyright
Other

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