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Grazing incidence X-ray reflectivity - Studies for the AXAF observatoryThe energy bandwidth and total throughput of a grazing incidence optics system is a strong function of the X-ray reflectivity of the surface coating. In support of the Advanced X-ray Astrophysics Facility (AXAF), studies are underway to evaluate and characterize the reflectivity of potential AXAF coatings. Here we report on results obtained for Au, Ir, and Ni coatings produced by electron-beam evaporation, evaporation with ion-assist, and sputtering. Effects of coating thickness and deposition angle have been evaluated at 6.4 and 8.1 keV; the highest reflectivities are those of the thinner, about 200 A vs about 700 A, coatings. While considerable variations exist, the best Ir samples have higher reflectivity than any of the Au coatings. Data results have been compared with models for theoretical reflectivity, particularly with regard to the effective density of the coatings. Independent measurements of the coating densities have been carried out for comparison with the reflectivity results.
Document ID
19930055664
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Slane, P.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Schwartz, D.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Van Speybroeck, L.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Jones, D.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Chappell, J.
(Harvard-Smithsonian Center for Astrophysics Cambridge, MA, United States)
Bilbro, J.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Shapiro, A.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Dave, S.
(Hughes Optical Systems Danbury, CT, United States)
Kidd, P.
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Texter, S.
(TRW, Inc. Redondo Beach, CA, United States)
Date Acquired
August 16, 2013
Publication Date
January 1, 1992
Publication Information
Publication: In: Multilayer and grazing incidence X-ray(EUV optics; Proceedings of the Meeting, San Diego, CA, July 22-24, 1991 (A93-39658 15-74)
Publisher: Society of Photo-Optical Instrumentation Engineers
Subject Category
Optics
Accession Number
93A39661
Distribution Limits
Public
Copyright
Other

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