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Wavelength dispersive analysis with the synchrotron x ray fluorescence microprobeA wavelength dispersive spectrometer (WDS) was tested on the synchrotron x ray fluorescence microprobe at Brookhaven National Laboratory. Compared to WDS spectra using an electron microprobe, the synchrotron WDS spectra have much better sensitivity and, due to the absence of bremsstrahlung radiation, lower backgrounds. The WDS spectrometer was successfully used to resolve REE L fluorescence spectra from standard glasses and transition metal K fluorescence spectra from kamacite.
Document ID
19940016244
Document Type
Conference Paper
Authors
Rivers, M. L. (Chicago Univ. Chicago, IL, United States)
Thorn, K. S. (Chicago Univ. Chicago, IL, United States)
Sutton, S. R. (Chicago Univ. Chicago, IL, United States)
Jones, K. W. (Brookhaven National Lab. Upton, NY., United States)
Bajt, S. (Chicago Univ. Chicago, IL, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: Lunar and Planetary Inst., Twenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z
Subject Category
INORGANIC AND PHYSICAL CHEMISTRY
Funding Number(s)
CONTRACT_GRANT: DE-AC02-76CH-00016
CONTRACT_GRANT: NAG9-106
CONTRACT_GRANT: DE-FG02-92ER-14244
CONTRACT_GRANT: NSF EAR-89-15699
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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