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Combined backscatter Moessbauer spectrometer/x ray fluorescence analyzer (BaMS/XRF) for extraterrestrial surfacesWe have designed and tested a prototype combined backscatter Moessbauer spectrometer and x-ray fluorescence analyzer (BaMS/XRF). A space qualified instrument based on this design would be suitable for in-situ use on planetary missions to the surfaces of the Moon (Artemis and lunar outpost), Mars (MESUR), asteroids, or other solid solar system objects. The BaMS/XRF instrument is designed to be capable of concurrent sample analyses for the mineralogy of iron-bearing phases and elemental composition without the need for sample preparation.
Document ID
Document Type
Conference Paper
Shelfer, T. D.
(Alabama Univ. Huntsville, AL, United States)
Wills, E. L.
(Alabama Univ. Huntsville, AL, United States)
Agresti, D. G.
(Alabama Univ. Huntsville, AL, United States)
Pimperl, M. M.
(Alabama Univ. Huntsville, AL, United States)
Shen, M. H.
(Alabama Univ. Huntsville, AL, United States)
Morris, R. V.
(NASA Lyndon B. Johnson Space Center Houston, TX., United States)
Nguyen, T.
(Lockheed Engineering and Sciences Co. Houston, TX., United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: Lunar and Planetary Inst., Twenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z
Subject Category
Inorganic And Physical Chemistry
Accession Number
Distribution Limits
Work of the US Gov. Public Use Permitted.

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