NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Combined backscatter Moessbauer spectrometer/x ray fluorescence analyzer (BaMS/XRF) for extraterrestrial surfacesWe have designed and tested a prototype combined backscatter Moessbauer spectrometer and x-ray fluorescence analyzer (BaMS/XRF). A space qualified instrument based on this design would be suitable for in-situ use on planetary missions to the surfaces of the Moon (Artemis and lunar outpost), Mars (MESUR), asteroids, or other solid solar system objects. The BaMS/XRF instrument is designed to be capable of concurrent sample analyses for the mineralogy of iron-bearing phases and elemental composition without the need for sample preparation.
Document ID
19940016288
Document Type
Conference Paper
Authors
Shelfer, T. D. (Alabama Univ. Huntsville, AL, United States)
Wills, E. L. (Alabama Univ. Huntsville, AL, United States)
Agresti, D. G. (Alabama Univ. Huntsville, AL, United States)
Pimperl, M. M. (Alabama Univ. Huntsville, AL, United States)
Shen, M. H. (Alabama Univ. Huntsville, AL, United States)
Morris, R. V. (NASA Lyndon B. Johnson Space Center Houston, TX., United States)
Nguyen, T. (Lockheed Engineering and Sciences Co. Houston, TX., United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: Lunar and Planetary Inst., Twenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z
Subject Category
INORGANIC AND PHYSICAL CHEMISTRY
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

IDRelationTitle19940015909Analytic PrimaryWorkshop on the Martian Northern Plains: Sedimentological, Periglacial, and Paleoclimatic Evolution19940016163Analytic PrimaryTwenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z