NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
bridging faults in bicmos circuitsCombining the advantages of CMOS and bipolar, BiCMOS is emerging as a major technology for many high performance digital and mixed signal applications. Recent investigations revealed that bridging faults can be a major failure mode in IC's. Effects of bridging faults in BiCMOS circuits are presented. Bridging faults between logical units without feedback and logical units with feedback are considered. Several bridging faults can be detected by monitoring the power supply current (I(sub DDQ) monitoring). Effects of bridging faults and bridging resistance on output logic levels were examined along with their effects on noise immunity.
Document ID
19940016632
Document Type
Conference Paper
Authors
Menon, Sankaran M.
(Colorado State Univ. Fort Collins, CO, United States)
Malaiya, Yashwant K.
(Colorado State Univ. Fort Collins, CO, United States)
Jayasumana, Anura P.
(Colorado State Univ. Fort Collins, CO, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1993
Publication Information
Publication: New Mexico Univ., The Fifth NASA Symposium on VLSI Design
Subject Category
ELECTRONICS AND ELECTRICAL ENGINEERING
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

IDRelationTitle19940016163Analytic PrimaryTwenty-Fourth Lunar and Planetary Science Conference. Part 3: N-Z