NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Electronic and Interfacial Properties of PD/6H-SiC Schottky Diode Gas SensorsPd/SiC Schottky diodes detect hydrogen and hydrocarbons with high sensitivity. Variation of the diode temperature from 100 C to 200 C shows that the diode sensitivity to propylene is temperature dependent. Long-term heat treating at 425 C up to 140 hours is carried out to determine the effect of extended heat treating on the diode properties and gas sensitivity. The heat treating significantly affects the diode's capacitive characteristics, but the diode's current carrying characteristics are much more stable with a large response to hydrogen. Scanning Electron Microscopy and X-ray Spectrometry studies of the Pd surface after the heating show cluster formation and background regions with grain structure observed in both regions. The Pd and Si concentrations vary between grains. Auger Electron Spectroscopy depth profiles revealed that the heat treating promoted interdiffusion and reaction between the Pd and SiC dw broadened the interface region. This work shows that Pd/SiC Schottky diodes have significant potential as high temperature gas sensors, but stabilization of the structure is necessary to insure their repeatability in long-term, high temperature applications.
Document ID
19960047097
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Chen, Liang-Yu
(NASA Lewis Research Center Cleveland, OH United States)
Hunter, Gary W.
(NASA Lewis Research Center Cleveland, OH United States)
Neudeck, Philip G.
(NASA Lewis Research Center Cleveland, OH United States)
Bansal, Gaurav
(NASA Lewis Research Center Cleveland, OH United States)
Petit, Jeremy B.
(NYMA, Inc. Brook Park, OH United States)
Knight, Dak
(Cortez 3 Service Corp. Cleveland, OH United States)
Liu, Chung-Chiun
(Case Western Reserve Univ. Cleveland, OH United States)
Wu, Qinghai
(Case Western Reserve Univ. Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
June 1, 1996
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-TM-107255
E-10316
NAS 1.15:107255
Meeting Information
Meeting: International High Temperature Electronics Conference
Location: Alburquerque, NM
Country: United States
Start Date: June 9, 1996
End Date: June 14, 1996
Sponsors: Sandia National Labs.
Accession Number
96N32871
Funding Number(s)
CONTRACT_GRANT: NAS3-24816
PROJECT: RTOP 242-20-06
CONTRACT_GRANT: NAS3-27186
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
No Preview Available