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RF Transmission Lines on Silicon SubstratesA review of RF transmission lines on silicon substrates is presented. Through measurements and calculated results, it is shown that attenuation is dominated by conductor loss if silicon substrates with a resistivity greater than 2500 Ohm-cm are used. Si passivation layers affect the transmission line attenuation; however, measured results demonstrate that passivation layers do not necessarily increase attenuation. If standard, low resistivity Si wafers must be used, alternative transmission lines such as thin film microstrip and Co-Planar Waveguide (CPW) on thick polyimide layers must be used. Measured results presented here show that low loss per unit length is achievable with these transmission lines.
Document ID
20000032105
Acquisition Source
Glenn Research Center
Document Type
Preprint (Draft being sent to journal)
Authors
Ponchak, George E.
(NASA Glenn Research Center Cleveland, OH United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 1999
Subject Category
Communications And Radar
Meeting Information
Meeting: 1999 European Microwave Conference
Location: Munich
Country: Germany
Start Date: October 4, 1999
End Date: October 8, 1999
Sponsors: Institute of Electrical and Electronic Engineers
Funding Number(s)
PROJECT: RTOP 632-50-5D
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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