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The Path to Krypton and Xenon Isotopic Measurements from Few-Micron Sized Samples: III Kr Calibration and First Applications of the RIS-TOF SystemWe describe progress towards the micron-scale analysis of krypton isotopes in extraterrestrial material.
Document ID
20000080930
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Ocker, K. D. (Tennessee Univ. Knoxville, TN United States)
Thonnard, N. (Tennessee Univ. Knoxville, TN United States)
Gilmour, J. D. (Tennessee Univ. Knoxville, TN United States)
Joyner, C. F. (Tennessee Univ. Knoxville, TN United States)
Date Acquired
August 19, 2013
Publication Date
March 1, 2000
Publication Information
Publication: Lunar and Planetary Science XXXI
Subject Category
Lunar And Planetary Science And Exploration
Funding Number(s)
CONTRACT_GRANT: NAG5-3464
CONTRACT_GRANT: NAGW-4774
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle20000080557Collected WorksLunar and Planetary Science XXXI
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