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Field Ion Microscopy and Atom Probe Tomography of Metamorphic Magnetite CrystalsMagnetite has been analysed using Field Ion Microscopy (FIM) and Atom Probe Tomography (APT), highly attractive techniques for the nanoanalysis of geological materials despite the difficulties inherent in analyzing semiconducting and insulating materials. Additional information is contained in the original extended abstract.
Document ID
20010045070
Document Type
Conference Paper
Authors
Kuhlman, K.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Martens, R. L.
(Imago Scientific Instruments Corp. Madison, WI United States)
Kelly, T. F.
(Wisconsin Univ. Madison, WI United States)
Evans, N. D.
(Oak Ridge National Lab. TN United States)
Miller, M. K.
(Oak Ridge National Lab. TN United States)
Date Acquired
August 20, 2013
Publication Date
January 1, 2001
Publication Information
Publication: Lunar and Planetary Science XXXII
Subject Category
Lunar And Planetary Science And Exploration
Funding Number(s)
CONTRACT_GRANT: DE-AC05-00OR22725
CONTRACT_GRANT: DE-AC05-76OR00033
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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