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A New Measurement of the Absolute Spectral Reflectance of the MoonThe spectral reflectance of the Moon is an important property for studies of lunar geology, quantitative physical modeling of the moon, and in-flight calibration of spacecraft sensors. Previous studies have claimed that telescopic absolute reflectance values for the Moon are greater than laboratory reflectance measurements by a factor of two. In order to confirm these results, we performed ground-based observations of the lunar surface using a visible/near-infrared spectroradiometer and compared the measured lunar surface radiance to solar radiance corrected for atmospheric scattering and absorption. These data were compared to previously obtained laboratory reflectance measurements from Apollo soil samples.
Document ID
20030111392
Document Type
Conference Paper
Authors
Lawrence, S. J. (Hawaii Univ. Honolulu, HI, United States)
Lau, E. (Hawaii Univ. Honolulu, HI, United States)
Steutel, D. (Hawaii Univ. Honolulu, HI, United States)
Stopar, J. D. (Hawaii Univ. Honolulu, HI, United States)
Wilcox, B. B. (Hawaii Univ. Honolulu, HI, United States)
Lucey, P. G. (Hawaii Univ. Honolulu, HI, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2003
Publication Information
Publication: Lunar and Planetary Science XXXIV
Subject Category
Lunar and Planetary Science and Exploration
Funding Number(s)
CONTRACT_GRANT: NAG5-7855
Distribution Limits
Public
Copyright
Public Use Permitted.

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