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Current Single Event Effects Results for Candidate Spacecraft Electronics for NASAWe present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects. Devices tested include digital, analog, linear bipolar, and hybrid devices, among others.
Document ID
20040171177
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
OBryan, Martha V.
(Raytheon Information Technology and Scientific Services Greenbelt, MD, United States)
Seidleck, Christina M.
(Raytheon Information Technology and Scientific Services Greenbelt, MD, United States)
Carts, Martin A.
(Raytheon Information Technology and Scientific Services Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Marshall, Cheryl J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Reed, Robert A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Sanders, Anthony B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Hawkins, Donald K.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Cox, Stephen R.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kniffin, Scott D.
(Orbital Sciences Corp. McLean, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Electronics And Electrical Engineering
Meeting Information
Meeting: 2004 IEEE Nuclear and Space Radiation Effects Conference
Location: Atlanta, GA
Country: United States
Start Date: July 19, 2004
End Date: July 23, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: DTRA-IACRO-03-40351
CONTRACT_GRANT: DTRA-IACRO-04-40641
Distribution Limits
Public
Copyright
Public Use Permitted.
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