NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASAVulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is studied. Devices tested include digital, linear bipolar, and hybrid devices.
Document ID
20050210237
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
O'Bryan, Martha V.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Ladbury, Ray L.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Howard, James W., Jr.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kniffin, Scott D.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Forney, James D.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Irwin, Tim
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kim, H.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Buchner, Stephen P.
(QSS Group, Inc. Greenbelt, MD, United States)
Oldham, Timothy R.
(QSS Group, Inc. Greenbelt, MD, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2005
Subject Category
Spacecraft Instrumentation And Astrionics
Meeting Information
Meeting: 2005 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
Location: Seattle, WA
Country: United States
Start Date: July 15, 2005
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
No Preview Available