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Radiation Characterization of a 0.11 micrometer Modified Commercial CMOS ProcessThis viewgraph presentation reviews the tests of a modified commercial CMOS chip for operation in radiation environments. The presentation has pictures of the chip, and charts of the test results.
Document ID
20060027782
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Poivey, C.
(Mei Technology Corp. San Antonio, TX, United States)
Kim, H.
(Mei Technology Corp. San Antonio, TX, United States)
Vilchis, M.
(LSI Logic Corp. CA, United States)
Forney, J.
(Mei Technology Corp. San Antonio, TX, United States)
Phan, A.
(Mei Technology Corp. San Antonio, TX, United States)
LaBel, K.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Saigusa, R.
(LSI Logic Corp. CA, United States)
Finlinson, R.
(LSI Logic Corp. CA, United States)
Sukharnov, A.
(LSI Logic Corp. CA, United States)
Hornback, V.
(LSI Logic Corp. CA, United States)
Song, J.
(LSI Logic Corp. CA, United States)
Tung, J.
(LSI Logic Corp. CA, United States)
Mirabedini, M.
(LSI Logic Corp. CA, United States)
Date Acquired
August 23, 2013
Publication Date
January 1, 2006
Subject Category
Computer Operations And Hardware
Meeting Information
Meeting: 2006 Single Event Effects Symposium (SEESYM)
Location: Long Beach,CA
Country: United States
Start Date: April 10, 2006
End Date: April 12, 2006
Distribution Limits
Public
Copyright
Public Use Permitted.
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