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Magnetic-Field Sensitive Line Ratios in EUV and Soft X-ray SpectraWe discovered a class of lines that are sensitive to the strength of the ambient magnetic field, and present a measurement of such a line in Ar IX near 49 A. Calculations show that the magnitude of field strengths that can be measured ranges from a few hundred gauss to several tens of kilogauss depending on the particular ion emitting the line.
Document ID
20060052434
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Beiersdorfer, P. (Lawrence Livermore National Lab. Livermore, CA, United States)
Scofield, J. (Lawrence Livermore National Lab. Livermore, CA, United States)
Brown, G. V. (Lawrence Livermore National Lab. Livermore, CA, United States)
Chen, H. (Lawrence Livermore National Lab. Livermore, CA, United States)
Trabert, E. (Lawrence Livermore National Lab. Livermore, CA, United States)
Lepson, J. K. (California Univ. Berkeley, CA, United States)
Date Acquired
August 23, 2013
Publication Date
August 1, 2006
Publication Information
Publication: Proceedings of the NASA Laboratory Astrophysics Workshop
Subject Category
Astrophysics
Funding Number(s)
CONTRACT_GRANT: W-7405-eng-48
CONTRACT_GRANT: NNH04AA75I
Distribution Limits
Public
Copyright
Public Use Permitted.

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