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Improved On-Chip Measurement of Delay in an FPGA or ASICAn improved design has been devised for on-chip-circuitry for measuring the delay through a chain of combinational logic elements in a field-programmable gate array (FPGA) or application-specific integrated circuit (ASIC). In the improved design, the delay chain does not include input and output buffers and is not configured as an oscillator. Instead, the delay chain is made part of the signal chain of an on-chip pulse generator. The duration of the pulse is measured on-chip and taken to equal the delay.
Document ID
20100002235
Acquisition Source
Jet Propulsion Laboratory
Document Type
Other - NASA Tech Brief
Authors
Chen, Yuan
(California Inst. of Tech. Pasadena, CA, United States)
Burke, Gary
(California Inst. of Tech. Pasadena, CA, United States)
Sheldon, Douglas
(California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
August 25, 2013
Publication Date
June 1, 2007
Publication Information
Publication: NASA Tech Briefs, June 2007
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
NPO-43348
Distribution Limits
Public
Copyright
Public Use Permitted.
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