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Correlation Between Analog Noise Measurements and the Expected Bit Error Rate of a Digital Signal Propagating Through Passive ComponentsA method of determining the bit error rate (BER) of a digital circuit from the measurement of the analog S-parameters of the circuit has been developed. The method is based on the measurement of the noise and the standard deviation of the noise in the S-parameters. Once the standard deviation and the mean of the S-parameters are known, the BER of the circuit can be calculated using the normal Gaussian function.
Document ID
20120016799
Acquisition Source
Glenn Research Center
Document Type
Technical Memorandum (TM)
Authors
Warner, Joseph D.
(NASA Glenn Research Center Cleveland, OH, United States)
Theofylaktos, Onoufrios
(NASA Glenn Research Center Cleveland, OH, United States)
Date Acquired
August 26, 2013
Publication Date
October 1, 2012
Subject Category
Communications And Radar
Report/Patent Number
E-17994
NASA/TM-2012-217238
Funding Number(s)
WBS: WBS 789822.01.03.03
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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