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The DUV Stability of Superlattice-Doped CMOS Detector ArraysNo abstract available
Document ID
20150007342
Acquisition Source
Jet Propulsion Laboratory
Document Type
Presentation
External Source(s)
hdl:2014/44077
Authors
Hoenk, M. E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Carver, A. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Jones, T. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Dickie, M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Cheng, P. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Greer, F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Nikzad, S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Sgro, J. (Alacron, Inc. Nashua, NH, United States)
Tsur, S. (Applied Materials, Inc. Santa Clara, CA, United States)
Date Acquired
May 5, 2015
Publication Date
June 12, 2013
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: International Image Sensor Workshop
Location: Snowbird, UT
Country: United States
Start Date: June 12, 2013
End Date: June 16, 2013
Sponsors: International Image Sensor Society (IISS)
Distribution Limits
Public
Copyright
Other
Keywords
molecular beam epitaxy
superlattices doping
molecular-beam epitaxy (MBE)
ultraviolet
Complementary metal-oxide-semiconductor (CMOS)
imaging dectors

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