Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
Authors
Hoenk, M. E. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Carver, A. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Jones, T. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Dickie, M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Cheng, P. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Greer, H. F. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Nikzad, S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States) Sgro, J. (Alacron, Inc. Nashua, NH, United States) Date Acquired
May 5, 2015
Publication Date
June 12, 2013
Subject Category
Instrumentation And Photography Meeting Information
Meeting: International Image Sensors Workshop (IISW)
Location: Snowbird, UT
Country: United States
Start Date: June 12, 2013
End Date: June 16, 2013
Sponsors: International Image Sensor Society (IISS)
Distribution Limits
Public
Keywords
doped silicon surfacesquantum engineering