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Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm SOI CMOS ProcessorNo abstract available
Document ID
20160000796
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
LaBel, Kenneth A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Carts, Martin A.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Gigliuto, Robert A.
(MEI Technologies, Inc. Seabrook, MD, United States)
Szabo, Carl M., Jr.
(Dell Services Federal Government, Inc. Seabrook, MD, United States)
Kay, Matt
(Naval Sea Systems Command Arlington, VA, United States)
Sinclair, Tim
(Naval Sea Systems Command Arlington, VA, United States)
Gadlage, Matt
(Naval Sea Systems Command Arlington, VA, United States)
Duncan, Adam
(Naval Sea Systems Command Arlington, VA, United States)
Ingalls, Dave
(Naval Sea Systems Command Arlington, VA, United States)
Date Acquired
January 13, 2016
Publication Date
July 8, 2013
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-500-13-D-0167
Meeting Information
Meeting: Nuclear and Radiation Effects Conference
Location: San Francisco, CA
Country: United States
Start Date: July 8, 2013
End Date: July 12, 2013
Sponsors: Institute of Electrical and Electronics Engineers
Distribution Limits
Public
Copyright
Public Use Permitted.
No Preview Available