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NEPP Independent Single Event Upset Testing of the Microsemi RTG4: Preliminary DataWe present an independent investigation of heavy-ion single event effect data for the Microsemi RTG4 field programmable gate array (FPGA).


Document ID
20160007753
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (ASRC Federal Space and Defense Greenbelt, MD, United States)
LaBel, Kenneth (NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, Jonathan (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
June 20, 2016
Publication Date
June 13, 2016
Subject Category
Quality Assurance And Reliability
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN32955
Meeting Information
Meeting: 2016 NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: United States
Start Date: June 13, 2016
End Date: June 16, 2016
Sponsors: NASA Goddard Space Flight Center
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
single event transients (SETs)
single event upsets (SEUs)
; Error Correction and Detection (EDAC)
Microsemi RTG4
Safe-State Machines
Field Programmable Gate Array (FPGA)
heavy ion
Hot and Cold Sparing

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