NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Press Enter or click the Search button to begin your search.

Back to Results
Jet Fuel Thermal Stability Investigations using EllipsometryEllipsometry is an optical technique used to measure the thickness of thin films. This technique was used to measure the thickness of deposits created by heated jet fuel, specifically Sasol IPK on stainless steel tubes. A new amorphous model was used to iteratively determine the film thickness. This method was found to be repeatable, and the thickness of deposit increased with increasing temperature and increasing concentration of naphthalene.
Document ID
20170005184
Acquisition Source
Glenn Research Center
Document Type
Presentation
Authors
Nash, Leigh
(University of Central Florida Orlando, FL, United States)
Klettlinger, Jennifer
(NASA Glenn Research Center Cleveland, OH United States)
Vasu, Subith
(University of Central Florida Orlando, FL, United States)
Date Acquired
June 6, 2017
Publication Date
January 9, 2017
Subject Category
Fluid Mechanics And Thermodynamics
Propellants And Fuels
Report/Patent Number
GRC-E-DAA-TN38641
Report Number: GRC-E-DAA-TN38641
Meeting Information
Meeting: AIAA SciTech 2017
Location: Grapevine, TX
Country: United States
Start Date: January 9, 2017
End Date: January 13, 2017
Sponsors: American Inst. of Aeronautics and Astronautics
Funding Number(s)
WBS: WBS 081876.02.03.04.01.01
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
aviation fuel
thermal stability
ellipsometry
No Preview Available