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Confidence Level Based Approach to Total Dose Specification for Spacecraft ElectronicsA confidence level based approach to total dose radiation hardness assurance is presented for spacecraft electronics. It is applicable to both ionizing and displacement damage dose. Results are compared to the traditional approach that uses radiation design margin and advantages of the new approach are discussed.
Document ID
20170005803
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Xapsos, M. A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Stauffer, C. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Phan, A. (ASRC Federal Space and Defense Greenbelt, MD, United States)
McClure, S. S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ladbury, R. L. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Pellish, J. A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Campola, M. J. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Label, K. A. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
June 28, 2017
Publication Date
June 26, 2017
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN43269
Meeting Information
Meeting: NEPP Electronics Technology Workshop (ETW)
Location: Greenbelt, MD
Country: United States
Start Date: June 26, 2017
End Date: June 29, 2017
Sponsors: NASA Headquarters
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Public Use Permitted.
Keywords
Total Dose Distributions in Space
radiation hardness assurance
Device Failure Probability

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