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A Survey of Xenon Ion Sputter Yield Data and Fits Relevant to Electric Propulsion Spacecraft IntegrationA survey of low energy xenon ion impact sputter yields was conducted to provide a more coherent baseline set of sputter yield data and accompanying fits for electric propulsion integration. Data uncertainties are discussed and different available curve fit formulas are assessed for their general suitability. A Bayesian parameter fitting approach is used with a Markov chain Monte Carlo method to provide estimates for the fitting parameters while characterizing the uncertainties for the resulting yield curves.
Document ID
20170009068
Acquisition Source
Glenn Research Center
Document Type
Conference Paper
Authors
Yim, John T.
(NASA Glenn Research Center Cleveland, OH United States)
Date Acquired
September 26, 2017
Publication Date
October 8, 2017
Subject Category
Spacecraft Propulsion And Power
Report/Patent Number
GRC-E-DAA-TN45154
Report Number: GRC-E-DAA-TN45154
Meeting Information
Meeting: International Electric Propulsion Conference (IEPC)
Location: Atlanta, GA
Country: United States
Start Date: October 8, 2017
End Date: October 12, 2017
Sponsors: Georgia Inst. of Tech.
Funding Number(s)
WBS: WBS 729200.02.03.03
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
xenon
sputtering
ion impact
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