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Testing the Tester: Lessons Learned During the Testing of a State-of-the-Art Commercial 14nm Processor Under Proton IrradiationTesting of an Intel 14nm desktop processor was conducted under proton irradiation. We share lessons learned, demonstrating that complex devices beget further complex challenges requiring practical and theoretical investigative expertise to solve.
Document ID
20170009868
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Szabo, Carl M., Jr. (ASRC Federal Space and Defense Greenbelt, MD, United States)
Duncan, Adam R. (Naval Surface Warfare Center Annapolis, MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
October 11, 2017
Publication Date
October 3, 2017
Subject Category
Computer Operations And Hardware
Electronics And Electrical Engineering
Report/Patent Number
GSFC-E-DAA-TN47135
GSFC-E-DAA-TN64771
2017-561-NEPP
Report Number: GSFC-E-DAA-TN47135
Report Number: GSFC-E-DAA-TN64771
Report Number: 2017-561-NEPP
Meeting Information
Meeting: Radiation Effects on Components and Systems Conference (RADECS 2017)
Location: Geneva
Country: Switzerland
Start Date: October 2, 2017
End Date: October 6, 2017
Sponsors: European Organization for Nuclear Research, Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: NNG13CR48C
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.
Keywords
commercial
test methods
proton facilities
single event effects (SEE)

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