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Evaluation of System Reliability and Heavy Ion Angular EffectsMicrosemi (Microchip) RTG4 embedded triple modular redundant (TMR) phase-locked-loop (PLL) SEU data is presented. SEU data analysis includes: 1) Evaluation of heavy-ion beam angular effects (rectangular parallel pipe (RPP) or no RPP), 2) Importance of finding linear energy transfer (LET) onset (L0), 3) Comparison of prediction rate techniques.
Document ID
20190000638
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Berg, Melanie (Science Systems and Applications, Inc. Lanham, MD, United States)
Campola, Michael (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
February 11, 2019
Publication Date
February 5, 2019
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
2019-561-NEPP
GSFC-E-DAA-TN65147
Report Number: 2019-561-NEPP
Report Number: GSFC-E-DAA-TN65147
Meeting Information
Meeting: Microelectronics Reliability and Qualification Workshop (MRQW)
Location: El Segundo, CA
Country: United States
Start Date: February 5, 2019
End Date: February 7, 2019
Sponsors: Aerospace Corp.
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Portions of document may include copyright protected material.
Technical Review
Single Expert
Keywords
Space radiation environments

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